Title :
Comparison of spatial coherence properties of EUV/soft X-ray undulator, laser and high-order harmonic generation sources
Author :
Liu, Yanwei ; Naulleau, Patrick ; Attwood, David T.
Author_Institution :
Center for X-ray Opt., Lawrence Berkeley Nat. Lab., CA, USA
Abstract :
Summary form only given. Motivation for the development of coherent X-ray sources comes from many areas of science and technology. To date, undulators in third-generation synchrotrons are leading sources for high average power coherent radiation in extreme ultraviolet (EUV)/soft X-ray region, while there are also great efforts to make compact size EUV/soft X-ray sources. Two active research fields are soft X-ray lasers and high-order harmonic generation (HHG). Recently, there have been significant progresses in both fields
Keywords :
X-ray lasers; X-ray optics; X-ray production; optical harmonic generation; wigglers; compact size EUV; high average power coherent radiation; high-order harmonic generation; high-order harmonic generation sources; soft X-ray laser sources; soft X-ray region; soft X-ray undulator; spatial coherence properties; third-generation synchrotrons; Frequency conversion; Holography; Laser theory; Optical interferometry; Optical pulse generation; Spatial coherence; Synchrotrons; Ultraviolet sources; Undulators; X-ray lasers;
Conference_Titel :
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location :
San Francisco, CA
Print_ISBN :
0-7803-5634-9
DOI :
10.1109/LEOS.1999.813472
