DocumentCode
3492647
Title
An EMI resisting LIN driver
Author
Redouté, Jean-Michel ; Steyaert, Michiel
Author_Institution
Dept. ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee
fYear
2006
fDate
Sept. 2006
Firstpage
580
Lastpage
583
Abstract
This paper describes the design of a LIN driver structure, which offers a high degree of immunity against conducted electromagnetic interference (EMI): this circuit withstands the highest levels of the "direct power injection" measurements, while continuing to deliver an unaltered duty cycle, which is mandatory to obtain an error free data transmission
Keywords
driver circuits; electromagnetic interference; immunity testing; integrated circuit noise; interference suppression; EMI; LIN driver structure; direct power injection measurements; electromagnetic interference; error free data transmission; local interconnect network; Automotive applications; Data communication; Driver circuits; Electrical resistance measurement; Electromagnetic interference; Home appliances; Power measurement; Shape control; Shape measurement; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location
Montreux
ISSN
1930-8833
Print_ISBN
1-4244-0303-0
Type
conf
DOI
10.1109/ESSCIR.2006.307491
Filename
4099833
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