Title :
An EMI resisting LIN driver
Author :
Redouté, Jean-Michel ; Steyaert, Michiel
Author_Institution :
Dept. ESAT-MICAS, Katholieke Universiteit Leuven, Heverlee
Abstract :
This paper describes the design of a LIN driver structure, which offers a high degree of immunity against conducted electromagnetic interference (EMI): this circuit withstands the highest levels of the "direct power injection" measurements, while continuing to deliver an unaltered duty cycle, which is mandatory to obtain an error free data transmission
Keywords :
driver circuits; electromagnetic interference; immunity testing; integrated circuit noise; interference suppression; EMI; LIN driver structure; direct power injection measurements; electromagnetic interference; error free data transmission; local interconnect network; Automotive applications; Data communication; Driver circuits; Electrical resistance measurement; Electromagnetic interference; Home appliances; Power measurement; Shape control; Shape measurement; Voltage;
Conference_Titel :
Solid-State Circuits Conference, 2006. ESSCIRC 2006. Proceedings of the 32nd European
Conference_Location :
Montreux
Print_ISBN :
1-4244-0303-0
DOI :
10.1109/ESSCIR.2006.307491
