• DocumentCode
    3492980
  • Title

    Capacitively-loaded travelling-wave electrodes for electro-optic modulators

  • Author

    Jaeger, Nicolas A F ; Rahmatian, Farnoosh ; Kato, Hiroshi ; James, Robert ; Berolo, Ezio

  • Author_Institution
    Dept. of Electr. Eng., British Columbia Univ., Vancouver, BC, Canada
  • Volume
    2
  • fYear
    1995
  • fDate
    5-8 Sep 1995
  • Firstpage
    1166
  • Abstract
    Capacitively-loaded, travelling-wave, coplanar strip electrodes were fabricated on a semi-insulating GaAs substrate. Microwave index and attenuation measurements were performed on them at frequencies up to 40 GHz. Such electrodes are intended for use in integrated-optic Mach-Zehnder type electro-optic modulators fabricated using compound semiconductors. They are, in fact, intended to achieve the necessary microwave/lightwave velocity-match condition for graded index AlGaAs or InGaAsP waveguides fabricated on GaAs or InP substrates. We report microwave indices close to 3.2 and losses as small as 2 dB/cm, measured at 40 GHz, for the structures studied here
  • Keywords
    Mach-Zehnder interferometers; coplanar waveguides; electro-optical modulation; electrodes; electromagnetic wave absorption; gradient index optics; integrated optics; microwave measurement; optical planar waveguides; 40 GHz; AlGaAs; AlGaAs waveguides; GaAs; InGaAsP; InGaAsP waveguides; InP; InP substrate; attenuation measurements; capacitively-loaded travelling-wave electrodes; coplanar strip electrodes; electro-optic modulators; graded index waveguides; integrated-optic Mach-Zehnder type electro-optic modulators; losses; microwave index; microwave indices; microwave/lightwave velocity-match condition; semi-insulating GaAs substrate; Attenuation measurement; Electrodes; Electrooptic modulators; Frequency; Gallium arsenide; Indium phosphide; Performance evaluation; Semiconductor waveguides; Strips; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Computer Engineering, 1995. Canadian Conference on
  • Conference_Location
    Montreal, Que.
  • ISSN
    0840-7789
  • Print_ISBN
    0-7803-2766-7
  • Type

    conf

  • DOI
    10.1109/CCECE.1995.526638
  • Filename
    526638