Title :
Temperature effects on crosstalk in carbon nanotube interconnects
Author :
Jia, Lei ; Yin, Wen-Yan
Author_Institution :
Center for Microwave & RF Technol., Shanghai Jiao Tong Univ., Shanghai
Abstract :
In this paper, the authors propose two modified temperature-dependent equivalent circuit models for single- and double-walled carbon nanotube (SWCNT & DWCNT) interconnects at first, and the temperature effect on crosstalk in SWCNT and DWCNT interconnects are investigated, respectively. The crosstalk-induced delay and noise of these novel interconnects are characterized numerically over a temperature range from 300 to 600K. The simulation results show that the crosstalk-induced delay increases significantly and the noise increases slightly while the temperature is raised, which indicate that the performance and reliability degrade with an increase in CNT interconnects temperature.
Keywords :
carbon nanotubes; delays; integrated circuit interconnections; integrated circuit noise; carbon nanotube interconnect crosstalk; crosstalk induced delay; equivalent circuit model; temperature 300 K to 600 K; temperature effects; Capacitance; Carbon nanotubes; Contact resistance; Crosstalk; Electrostatics; Equivalent circuits; Inductance; Integrated circuit interconnections; Optical scattering; Temperature;
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
DOI :
10.1109/APMC.2008.4958645