Title :
High-value capacitance measurement based on inductive shunt
Author :
Xue, Dai Dong ; Bing, He Xiao ; Wei, Wang
Author_Institution :
Nat. Inst. of Metrol., Beijing, China
Abstract :
This paper describes a new high-value capacitance measurement method based on the inductive shunt. The method is used to measure capacitance from 10 μF to 1 mF, frequency from 100 Hz to 1 kHz.
Keywords :
capacitance measurement; capacitance 10 muF to 1 mF; frequency 100 Hz to 1 kHz; high-value capacitance measurement method; inductive shunt; Capacitance measurement; Electromagnetic measurements;
Conference_Titel :
Precision Electromagnetic Measurements (CPEM), 2010 Conference on
Conference_Location :
Daejeon
Print_ISBN :
978-1-4244-6795-2
DOI :
10.1109/CPEM.2010.5545299
