Title :
Measurement of loss mechanisms in microwave coaxial resonator filters
Author :
Maas, S. ; Meyer, P. ; van der Walt, P.W.
Author_Institution :
Dept. EE Eng., Stellenbosch Univ., Stellenbosch, South Africa
Abstract :
Various loss mechanisms in microwave coaxial resonators are investigated through measurement. The effects of structure, manufacturing techniques, polishing techniques and plating on the Q-factor are compared for an S-band resonator. It is experimentally established that wire-cutting followed by silver plating results in the highest Q-values, which are also comparable with simulation results.
Keywords :
Q-factor; loss measurement; microwave filters; microwave resonators; resonator filters; silver; Ag; Q-factor; S-band resonator; loss mechanisms; manufacturing techniques; microwave coaxial resonator filters; polishing techniques; silver plating; wire-cutting; Aluminum; Loss measurement; Microwave filters; Q-factor; Rough surfaces; Surface roughness; Q-values; manufacturing; plating; resonator;
Conference_Titel :
AFRICON, 2013
Conference_Location :
Pointe-Aux-Piments
Print_ISBN :
978-1-4673-5940-5
DOI :
10.1109/AFRCON.2013.6757636
