DocumentCode
349323
Title
Material issues in reliability of optical fiber communication lasers
Author
Chu, S.N.G.
Author_Institution
Lucent Technol., Bell Labs., Murray Hill, NJ, USA
Volume
1
fYear
1999
fDate
1999
Firstpage
196
Abstract
Reliability of telecommunication laser diodes at their normal operation conditions is usually estimated by extrapolation of degradation rates obtained at accelerated aging conditions. The statistical method of prediction of the mean lifetime to failure is currently the standard way for qualifying a product as well as its manufacturing process
Keywords
ageing; life testing; optical testing; optical transmitters; probability; semiconductor device reliability; semiconductor device testing; semiconductor lasers; telecommunication network reliability; accelerated aging test conditions; degradation rates; extrapolation; manufacturing process; mean lifetime to failure prediction; normal operation conditions; optical fiber communication laser reliability; statistical method; telecommunication laser diode reliability; Accelerated aging; Degradation; Fiber lasers; Materials reliability; Optical fiber communication; Optical materials; Statistical analysis; Telecommunications; Testing; Threshold current;
fLanguage
English
Publisher
ieee
Conference_Titel
LEOS '99. IEEE Lasers and Electro-Optics Society 1999 12th Annual Meeting
Conference_Location
San Francisco, CA
ISSN
1092-8081
Print_ISBN
0-7803-5634-9
Type
conf
DOI
10.1109/LEOS.1999.813546
Filename
813546
Link To Document