• DocumentCode
    3493516
  • Title

    Channel temperature model for microwave AlGaN/GaN power HEMTs on SiC and sapphire

  • Author

    Freeman, Jon C.

  • Author_Institution
    Glenn Res. Center, Nat. Aeronaut. & Space Adm., Cleveland, OH, USA
  • Volume
    3
  • fYear
    2004
  • fDate
    6-11 June 2004
  • Firstpage
    2031
  • Abstract
    A key parameter in the design trade-offs made during AlGaN/GaN HEMTs development for microwave amplifiers is the channel temperature. An accurate determination can generally only be found using detailed software; however, a quick estimate is always helpful, as it speeds up the design cycle. This paper gives a simple technique to estimate the channel temperature of a generic AlGaN/GaN HEMT on SiC or sapphire, while incorporating the temperature dependence of the thermal conductivity. The procedure is validated by comparing its predictions with the experimentally measured temperatures in microwave devices presented in three recently published articles. The model predicts the temperature to within 5 to 10 percent of the true average channel temperature.
  • Keywords
    III-V semiconductors; aluminium compounds; microwave devices; microwave power amplifiers; power HEMT; sapphire; semiconductor device models; silicon compounds; wide band gap semiconductors; AlGaN-GaN; channel temperature model; microwave amplifiers; microwave devices; microwave power HEMT; temperature dependence; thermal conductivity; thermal model; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs; Microwave amplifiers; Microwave measurements; Silicon carbide; Temperature dependence; Temperature measurement; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2004 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-8331-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2004.1339012
  • Filename
    1339012