DocumentCode :
3493516
Title :
Channel temperature model for microwave AlGaN/GaN power HEMTs on SiC and sapphire
Author :
Freeman, Jon C.
Author_Institution :
Glenn Res. Center, Nat. Aeronaut. & Space Adm., Cleveland, OH, USA
Volume :
3
fYear :
2004
fDate :
6-11 June 2004
Firstpage :
2031
Abstract :
A key parameter in the design trade-offs made during AlGaN/GaN HEMTs development for microwave amplifiers is the channel temperature. An accurate determination can generally only be found using detailed software; however, a quick estimate is always helpful, as it speeds up the design cycle. This paper gives a simple technique to estimate the channel temperature of a generic AlGaN/GaN HEMT on SiC or sapphire, while incorporating the temperature dependence of the thermal conductivity. The procedure is validated by comparing its predictions with the experimentally measured temperatures in microwave devices presented in three recently published articles. The model predicts the temperature to within 5 to 10 percent of the true average channel temperature.
Keywords :
III-V semiconductors; aluminium compounds; microwave devices; microwave power amplifiers; power HEMT; sapphire; semiconductor device models; silicon compounds; wide band gap semiconductors; AlGaN-GaN; channel temperature model; microwave amplifiers; microwave devices; microwave power HEMT; temperature dependence; thermal conductivity; thermal model; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs; Microwave amplifiers; Microwave measurements; Silicon carbide; Temperature dependence; Temperature measurement; Thermal conductivity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN :
0149-645X
Print_ISBN :
0-7803-8331-1
Type :
conf
DOI :
10.1109/MWSYM.2004.1339012
Filename :
1339012
Link To Document :
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