DocumentCode
3493516
Title
Channel temperature model for microwave AlGaN/GaN power HEMTs on SiC and sapphire
Author
Freeman, Jon C.
Author_Institution
Glenn Res. Center, Nat. Aeronaut. & Space Adm., Cleveland, OH, USA
Volume
3
fYear
2004
fDate
6-11 June 2004
Firstpage
2031
Abstract
A key parameter in the design trade-offs made during AlGaN/GaN HEMTs development for microwave amplifiers is the channel temperature. An accurate determination can generally only be found using detailed software; however, a quick estimate is always helpful, as it speeds up the design cycle. This paper gives a simple technique to estimate the channel temperature of a generic AlGaN/GaN HEMT on SiC or sapphire, while incorporating the temperature dependence of the thermal conductivity. The procedure is validated by comparing its predictions with the experimentally measured temperatures in microwave devices presented in three recently published articles. The model predicts the temperature to within 5 to 10 percent of the true average channel temperature.
Keywords
III-V semiconductors; aluminium compounds; microwave devices; microwave power amplifiers; power HEMT; sapphire; semiconductor device models; silicon compounds; wide band gap semiconductors; AlGaN-GaN; channel temperature model; microwave amplifiers; microwave devices; microwave power HEMT; temperature dependence; thermal conductivity; thermal model; Aluminum gallium nitride; Gallium nitride; HEMTs; MODFETs; Microwave amplifiers; Microwave measurements; Silicon carbide; Temperature dependence; Temperature measurement; Thermal conductivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Microwave Symposium Digest, 2004 IEEE MTT-S International
ISSN
0149-645X
Print_ISBN
0-7803-8331-1
Type
conf
DOI
10.1109/MWSYM.2004.1339012
Filename
1339012
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