Title :
The Simulation of Integrated Tool Performance in Semiconductor Manufacturing
Author :
Mauer, John L. ; Schelasin, Roland E A
Author_Institution :
IBM Technology Products, VT
Keywords :
Computational modeling; Electronic equipment manufacture; Manufacturing processes; Parallel processing; Reliability engineering; Robots; Semiconductor device manufacture; Semiconductor device modeling; Throughput; Virtual manufacturing;
Conference_Titel :
Simulation Conference Proceedings, 1993. Winter
Print_ISBN :
0-7803-1381-X
DOI :
10.1109/WSC.1993.718324