Title :
Numerical Calculation of Polynomial Chaos Coefficients for Stochastic Per-Unit-Length Parameters of Circular Conductors
Author :
Manfredi, Paolo ; Canavero, Flavio G.
Author_Institution :
Dipt. di Elettron. e Telecomun., Politec. di Torino, Turin, Italy
Abstract :
This paper presents a numerical procedure for the calculation of the polynomial chaos (PC)-expansion coefficients for the per-unit-length capacitance and inductance matrices of wire structures affected by random parameter variability. According to the recent literature results, these coefficients in turn allow the generation of electrical circuit models for stochastic cables. The procedure is based on the twofold expansion of the nonuniform and stochastic charge distributions on the wire boundaries in terms of both Fourier and PC expansions. A stochastic Galerkin method allows to cast the problem in terms of a deterministic system of equations, whose solution provides the unknown coefficients. The proposed methodology is validated via the generation of statistical models for wire structures with random parameters, whose probabilistic responses are compared against the results of Monte Carlo simulations.
Keywords :
Fourier analysis; Galerkin method; Monte Carlo methods; cables (electric); chaos; polynomial matrices; probability; random processes; statistical analysis; stochastic processes; wires (electric); Fourier expansion; Monte Carlo simulation; PC-expansion coefficient; circular conductor; electrical circuit model; inductance matrix; nonuniform charge distribution; numerical calculation; per-unit-length capacitance matrix; polynomial chaos-expansion coefficient; probabilistic response; random parameter variability; statistical model; stochastic Galerkin method; stochastic cable; stochastic charge distribution; stochastic per-unit-length parameter; wire structure; Capacitance; Conductors; Dielectrics; Equations; Stochastic processes; Transmission line matrix methods; Wires; Cable bundles; multiconductor transmission lines; polynomial chaos (PC); stochastic analysis; uncertainty;
Journal_Title :
Magnetics, IEEE Transactions on
DOI :
10.1109/TMAG.2013.2284140