Title :
Current generator for testing power semiconductor devices in high conduction state
Author :
Bespalov, N.N. ; Ilyin, M.V. ; Kapitonov, S.S.
Author_Institution :
N.P. Ogarev Res.-Eng. Center Radio-Eng. Instrum., Mordovian State Univ., Saransk, Russia
Abstract :
Paper describes current generator for testing power semiconductor devices in high conduction state. Modeling of generator operation is performed by Multisim software. Advantages of the generator are discussed.
Keywords :
power semiconductor devices; semiconductor device testing; Multisim software; current generator; high conduction state; power semiconductor devices testing; Educational institutions; Electronic mail; Generators; Instruments; Power semiconductor devices; TV; Testing;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6629090
