• DocumentCode
    3493755
  • Title

    Comparison of radiation temperature measurement precision between middlewave and longwave thermal-imaging systems

  • Author

    Sun, Zhiyuan ; Zhu, Wei

  • Author_Institution
    Changchun Inst. of Opt., Fine Mech. & Phys., Changchun, China
  • fYear
    2012
  • fDate
    23-25 Aug. 2012
  • Firstpage
    591
  • Lastpage
    596
  • Abstract
    A comparison study on temperature measurement precision between middlewave 3-5μm and longwave 8-12μm measuring thermal imaging systems has been conducted. The study was limited to systems working in indoor conditions and the target´s temperature is in the range of 270K~900K. First, the Disturb Resisting Function (DRF) of infrared systems is deduced. On the base of DRF curve, we find that the middlewave infrared system get the smaller influences under the same size disturb compared with the longwave system. A theory of the influence of target´s physical characteristic and measurement conditions on the accuracy of temperature measurements has been developed. On the basis of the developed formulas an analysis of the influence of signal disturbances (because of incorrectly assumed emissivity, limited transmittance of the atmosphere, radiation reflected by the object and shift of optics radiation) on the accuracy of temperature measurement has been made. It has been found that the middlewave systems in typical temperature range offer generally better accuracy in temperature measurement than the longwave ones do.
  • Keywords
    infrared imaging; temperature measurement; DRF curve; disturb resisting function; indoor conditions; infrared systems; longwave thermal-imaging systems; measurement conditions; middlewave thermal-imaging systems; optics radiation; physical characteristic; radiation temperature measurement precision; signal disturbances; temperature 270 K to 900 K; wavelength 3 mum to 5 mum; wavelength 8 mum to 12 mum; Accuracy; Atmosphere; Atmospheric measurements; Measurement uncertainty; Optics; Temperature distribution; Temperature measurement; infrared detector; radiation temperature measurement; thermal imaging systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Optoelectronics and Microelectronics (ICOM), 2012 International Conference on
  • Conference_Location
    Changchun, Jilin
  • Print_ISBN
    978-1-4673-2638-4
  • Type

    conf

  • DOI
    10.1109/ICoOM.2012.6316344
  • Filename
    6316344