Title :
Design-in for EMC on CMOS large-scale integrated circuits
Author_Institution :
Infineon Technol. AG, Munich, Germany
Abstract :
Meeting EMC demands is today and in future crucial to survive in the automotive, wireless and telecommunications market. This is valid not only for the system application level, but to a high grade already for semiconductor manufacturers. Testchips have been developed and evaluated at Infineon Technologies, reported previously by the author (2000). Research on signal integrity and RF noise decoupling inside the chips continues. This paper presents a set of design circuits and measures to improve EMC on silicon. The range is from RC low-pass noise filtering to improved I/O driver and clock distribution concepts. These measures have already been implemented in commercial products. Test results are shown from direct on-chip measurements and normative-compliant external emission measurements
Keywords :
CMOS integrated circuits; VLSI; clocks; electric current measurement; electric noise measurement; electromagnetic compatibility; electromagnetic interference; integrated circuit design; integrated circuit testing; low-pass filters; CMOS large-scale integrated circuits; EMC; EMC improvement; EMI; I/O driver; RC low-pass noise filtering; RF current measurement; RF noise decoupling; VLSI; automotive market; clock distribution; conducted emission measurement; design circuits; direct on-chip measurements; electromagnetic emission behaviour; normative-compliant external emission measurements; semiconductor manufacturers; signal integrity; system application level; telecommunications market; test chips; wireless market; Automotive engineering; CMOS integrated circuits; CMOS technology; Circuit noise; Circuit testing; Electromagnetic compatibility; Large scale integration; Semiconductor device manufacture; Semiconductor device measurement; Semiconductor device noise;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950505
