DocumentCode :
3493773
Title :
Wide-band measurements for frequency dependence of complex permittivity of a dielectric rod using multi-mode TM0m0 cavities
Author :
Nakai, Hiroshi ; Kobayashi, Yoshio ; Ma, Zhewang
Author_Institution :
Saitama Univ., Saitama
fYear :
2008
fDate :
16-20 Dec. 2008
Firstpage :
1
Lastpage :
4
Abstract :
To measure the frequency dependence of complex permittivity of a dielectric rod inserted in the center of a cylindrical cavity, a new method using the multi-mode TM0m0 of the cavity is developed on the basis of the rigorous analysis, where the effect of sample insertion holes is taken into account. Three cavities using the TM010 and TM020 modes and two cavities using the TM010, TM020, TM030 and TM040 modes are designed and manufactured with different sizes. These five cavities enable frequency dependence measurements of complex permittivity of a fused silica rod sample over eight octave bands from 3 to 26 GHz. The amount of scatter in the measured values of the relative permittivity and loss tangent are within 0.5% and 10%, respectively.
Keywords :
dielectric losses; dielectric materials; permittivity; rods (structures); silicon compounds; SiO2; TM010 mode; TM020 mode; TM030 mode; TM040 mode; complex permittivity; cylindrical cavity; dielectric rod; fused silica rod; loss tangent; multimode TM0m0 cavities; octave band; wide-band measurements; Conductivity; Dielectric loss measurement; Dielectric measurements; Electrical resistance measurement; Frequency dependence; Frequency measurement; Loss measurement; Permittivity measurement; Silicon compounds; Wideband;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Microwave Conference, 2008. APMC 2008. Asia-Pacific
Conference_Location :
Macau
Print_ISBN :
978-1-4244-2641-6
Electronic_ISBN :
978-1-4244-2642-3
Type :
conf
DOI :
10.1109/APMC.2008.4958679
Filename :
4958679
Link To Document :
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