• DocumentCode
    3493885
  • Title

    Multiscale skewed heavy tailed model for texture analysis

  • Author

    Lasmar, Nour-Eddine ; Stitou, Youssef ; Berthoumieu, Yannick

  • Author_Institution
    Groupe Signal, Univ. de Bordeaux, Bordeaux, France
  • fYear
    2009
  • fDate
    7-10 Nov. 2009
  • Firstpage
    2281
  • Lastpage
    2284
  • Abstract
    This paper deals with texture analysis based on multiscale stochastic modeling. In contrast to common approaches using symmetric marginal probability density functions of subband coefficients, experimental manipulations show that the symmetric shape assumption is violated for several texture classes. From this fact, we propose in this paper to exploit this shape property to improve texture characterization. We present Asymmetric Generalized Gaussian density as a model to represent detail subbands resulting from multiscale decomposition. A fast estimation method is presented and closed-form of Kullback-Leibler divergence is provided in order to validate the model into a retrieval scheme. The experimental results indicate that this model achieves higher recognition rates than the conventional approach of using the Generalized Gaussian model where asymmetry was not considered.
  • Keywords
    Gaussian processes; image retrieval; image texture; wavelet transforms; Kullback-Leibler divergence; asymmetric generalized Gaussian density; fast estimation method; image retrieval scheme; multiscale stochastic modeling; symmetric marginal probability density functions; symmetric shape assumption; texture analysis; Image processing; Image retrieval; Image texture analysis; Probability density function; Shape; Signal analysis; Statistical distributions; Stochastic processes; Wavelet analysis; Wavelet transforms; Asymmetric Generalized Gaussian density; Dual-Tree Complex Wavelet Transform; Image texture analysis; Kullback-Leibler Divergence; Texture Retrieval;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Image Processing (ICIP), 2009 16th IEEE International Conference on
  • Conference_Location
    Cairo
  • ISSN
    1522-4880
  • Print_ISBN
    978-1-4244-5653-6
  • Electronic_ISBN
    1522-4880
  • Type

    conf

  • DOI
    10.1109/ICIP.2009.5414404
  • Filename
    5414404