• DocumentCode
    349436
  • Title

    Crystalline effect on the lateral spread of implanted ions

  • Author

    Nakagawa, S.T. ; Hada, Y. ; Thome, L.

  • Author_Institution
    Graduate Sch. of Sci., Okayama Univ., Japan
  • Volume
    2
  • fYear
    1999
  • fDate
    36495
  • Firstpage
    767
  • Abstract
    We examined the lateral distribution of stopped ions in a crystalline target, considering the correlation between range straggling and the energy loss. Here we focused on the intermediate energy regime. The key quantity is the ratio of the lateral (ΔRL) to the longitudinal (ΔRp) range straggling in a crystalline target. Making use of a model of the impact-parameter dependent electronic stopping power, Se, we calculated ΔRL/ΔRp of 10 keV-1 MeV B ions and 20 keV-10 MeV As ions implanted into Si(100) target. The value ΔRL/ΔRp of random ions increased with ion velocity, and this agrees with previous results given for an amorphous target. The velocity dependence of ΔRL/ΔRp closely correlated with that of entire electronic energy loss. On the other hand, in the case of aligned incidence, the ΔRL/ΔRp looked almost invariant even at a high energy when ions receive the maximum S e. This difference was explained by means of different depth profiles of the energy transfer
  • Keywords
    elemental semiconductors; energy loss of particles; impurity distribution; ion implantation; silicon; 20 keV to 10 MeV; Si; Si(100); crystalline target; depth profiles; electronic stopping power; energy loss; implanted ions lateral spread; intermediate energy regime; ion velocity; lateral distribution; range straggling; stopped ions; velocity dependence; Amorphous materials; Crystallization; Crystals; Energy exchange; Energy loss; Integrated circuit modeling; Light scattering; Linear approximation; Microscopy; Slabs;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1998.813780
  • Filename
    813780