Title :
UWB and EMP susceptibility of modern electronics
Author :
Camp, Michael ; Garbe, Heyno ; Nitsch, Daniel
Author_Institution :
Inst. of the Basics of Electr. Eng. & Meas. Sci., Univ. of Hanover, NH, USA
Abstract :
The susceptibility of different types of single microcontrollers and complex microprocessor-boards to unipolar fast rise time pulses is determined. Rise times down to 100 ps and field amplitudes up to 50 kV/m have been applied to the devices
Keywords :
electromagnetic compatibility; electromagnetic pulse; microcontrollers; microprocessor chips; transients; 1.5 ns; 100 ps; EMC; EMP susceptibility; complex microprocessor boards; pulse field amplitudes; pulse rise times; single microcontrollers; transient electromagnetic field threat; unipolar fast rise time pulses; Circuit testing; EMP radiation effects; Electric breakdown; Electric variables measurement; Electromagnetic fields; Electromagnetic measurements; Magnetic field measurement; Microcontrollers; Probes; Time measurement;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950538
