DocumentCode :
3494370
Title :
High field domain formation and current-voltage hysteresis in selectively doped GaAs/AlGaAs multiple-quantum-well structures
Author :
Yoon, S.F. ; Radhakrishnan, Krishnaja ; Zhang, D.H. ; Han, Z.Y.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
fYear :
1996
fDate :
26-28 Nov 1996
Firstpage :
158
Lastpage :
163
Abstract :
We have studied the sequential tunneling of electrons in selectively doped GaAs/AlGaAs tight-binding multiple-quantum-wells (MQWs) using two structures with different doping profiles, one with Si doping in the AlGaAs barriers and other, with Si doping in the GaAs wells. In both the cases, the current-voltage (I-V) measurements showed two series of current oscillations which persisted up 200 K. The I-V characteristics also showed a hysteresis effect at increasing and decreasing voltage sweep. The voltage separations between the adjacent current oscillations in the I-V characteristics of the structures with ohmic and Schottky contact metallization give a good measure of the energy difference between the excited states and the ground state in the quantum-well, with good agreement with theoretical calculations. The process of sequential electron tunneling through the MQW structures is discussed in terms of the creation and extension of high-field domains (HFDs) due to the applied bias
Keywords :
III-V semiconductors; aluminium compounds; current fluctuations; doping profiles; electron-phonon interactions; excited states; gallium arsenide; ground states; high field effects; hysteresis; semiconductor doping; semiconductor quantum wells; tunnelling; 5 to 200 K; GaAs-AlGaAs:Si; GaAs:Si-AlGaAs; I-V characteristics hysteresis; Schottky contact metallization; Si doping; current oscillations; current-voltage measurements; doping profiles; energy difference; excited states; ground state; high field domain formation; ohmic contact metallization; phonon scattering miniband broadening; selectively doped GaAs/AlGaAs multiple-quantum-well structures; sequential electron tunneling; voltage separations; voltage sweep; Current measurement; Doping profiles; Electrons; Gallium arsenide; Hysteresis; Metallization; Quantum well devices; Schottky barriers; Tunneling; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
0-7803-3388-8
Type :
conf
DOI :
10.1109/SMELEC.1996.616474
Filename :
616474
Link To Document :
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