• DocumentCode
    3494606
  • Title

    Low threshold current GaAs/InGaAs vertical-cavity surface-emitting laser grown at a constant temperature by molecular beam epitaxy

  • Author

    Li, C.Y. ; Zhang, D.H. ; Yoon, S.F.

  • Author_Institution
    Sch. of Electr. & Electron. Eng., Nanyang Technol. Inst., Singapore
  • fYear
    1996
  • fDate
    26-28 Nov 1996
  • Firstpage
    164
  • Lastpage
    167
  • Abstract
    We report successful growth of low threshold current GaAs/InGaAs vertical cavity surface emitting lasers (VCSELs) by molecular beam epitaxy (MBE) at a constant temperature which is carefully selected in order not to deteriorate the quality of InGaAs and AlGas. The most important advantage of such constant temperature growth is the precise control of the thickness of each layer for the whole structure by using an infrared thermometer. It is demonstrated that the threshold current of our samples, patterned 15×15 μm2, at room temperature continuous wave operation is 700 μA and the maximum output power is about 800 μW at a lasing wavelength of 945 nm
  • Keywords
    III-V semiconductors; gallium arsenide; indium compounds; molecular beam epitaxial growth; quantum well lasers; reflectivity; semiconductor growth; surface emitting lasers; thickness control; 560 C; 700 muA; 800 muW; 945 nm; GaAs-InGaAs; GaAs/InGaAs vertical-cavity surface-emitting laser; MBE; VCSEL; constant temperature growth; infrared thermometer; lasing wavelength; low threshold current; maximum output power; reflectivity spectrum; room temperature continuous wave operation; thickness control; Distributed Bragg reflectors; Gallium arsenide; Indium gallium arsenide; Molecular beam epitaxial growth; Monitoring; Optical surface waves; Surface emitting lasers; Temperature; Threshold current; Vertical cavity surface emitting lasers;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
  • Conference_Location
    Penang
  • Print_ISBN
    0-7803-3388-8
  • Type

    conf

  • DOI
    10.1109/SMELEC.1996.616475
  • Filename
    616475