DocumentCode
3494736
Title
Applying S-graphs for modeling metrological support and control systems
Author
Palchun, Yu.A. ; Yelistratova, I.B. ; Yakimova, I.V. ; Zemtsov, C.P. ; Kvitkova, I.G.
fYear
2012
fDate
2-4 Oct. 2012
Firstpage
81
Lastpage
85
Abstract
Graphic presentation of metrological support and industry control systems is based on a structural configuration where separate elements are 2n-pole networks. The above-mentioned structural elements by formal operations are presented as flow graphs. To get graphic models we suggest using S-graph structures which are based on scatter matrix. SM contains all the information about the system behavior, fulfills the condition of normalization of probabilities and causality principle.
Keywords
S-matrix theory; causality; flow graphs; industrial control; probability; 2n-pole networks; S-graph structures; S-graphs; causality principle; control system modeling; flow graphs; formal operations; graphic presentation; industry control systems; metrological support modeling; probabilities normalization; scatter matrix; structural configuration; structural elements; graphic model; multipole network; scatter matrix;
fLanguage
English
Publisher
ieee
Conference_Titel
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location
Novosibirsk
Print_ISBN
978-1-4673-2842-5
Type
conf
DOI
10.1109/APEIE.2012.6629146
Filename
6629146
Link To Document