Title :
Applying S-graphs for modeling metrological support and control systems
Author :
Palchun, Yu.A. ; Yelistratova, I.B. ; Yakimova, I.V. ; Zemtsov, C.P. ; Kvitkova, I.G.
Abstract :
Graphic presentation of metrological support and industry control systems is based on a structural configuration where separate elements are 2n-pole networks. The above-mentioned structural elements by formal operations are presented as flow graphs. To get graphic models we suggest using S-graph structures which are based on scatter matrix. SM contains all the information about the system behavior, fulfills the condition of normalization of probabilities and causality principle.
Keywords :
S-matrix theory; causality; flow graphs; industrial control; probability; 2n-pole networks; S-graph structures; S-graphs; causality principle; control system modeling; flow graphs; formal operations; graphic presentation; industry control systems; metrological support modeling; probabilities normalization; scatter matrix; structural configuration; structural elements; graphic model; multipole network; scatter matrix;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6629146
