Title :
System models of metrological support and manufacturing control
Author :
Palchun, Yu.A. ; Yelistratova, I.B.
Abstract :
Growing manufacture automation, increasing demands as to the quality of management decisions require the refining of industry metrological support. To meet the demand the corresponding mathematical system models of metrological support and manufacturing control are being developed.
Keywords :
factory automation; management; manufacturing processes; measurement; management decisions; manufacture automation; manufacturing control; mathematical system models; metrological support; Model; management; metrological support; system;
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
DOI :
10.1109/APEIE.2012.6629147
