Title :
Ion beam mixing of Au/Fe multilayers by Ar ion implantation
Author :
Sakamoto, I. ; Honda, S. ; Tanoue, H. ; Hayashi, N. ; Nawate, M. ; Ikeda, Y.
Author_Institution :
Electrotech. Lab., Tsukuba, Japan
Abstract :
Physical properties of metallic multilayers (MLs) are strongly influenced by the layer and interface structure. We have investigated the ion implantation effects on Au/Fe MLs to improve and control the physical forms. The ion implantation has been performed to [0.3 nm Fe/1.2 nm Au]180 Au/Fe MLs with 400 and 800 keV Ar ions. The magnetization and Conversion Electron Mossbauer Spectroscopy (CEMS) measurements show the considerable changes in the physical properties by Ar ion implantation due to mixing processes. The result indicates that one can control the structural and magnetic properties of Au/Fe MLs by selecting an energy and a dose of Ar ion implantation
Keywords :
Mossbauer effect; argon; ferromagnetic materials; gold; interface structure; ion beam mixing; ion implantation; iron; magnetic multilayers; magnetisation; 0.3 nm; 1.2 nm; 400 keV; 800 keV; Ar ion implantation; Au-Fe; Au/Fe multilayers; Conversion Electron Mossbauer Spectroscopy; interface structure; ion beam mixing; magnetization; metallic multilayers; Argon; Electrons; Gold; Ion beams; Ion implantation; Iron; Magnetic properties; Magnetization; Multilevel systems; Nonhomogeneous media;
Conference_Titel :
Ion Implantation Technology Proceedings, 1998 International Conference on
Conference_Location :
Kyoto
Print_ISBN :
0-7803-4538-X
DOI :
10.1109/IIT.1998.813832
