Title :
High efficiency power amplifier input/output circuit topologies for base station and WLAN applications
Author :
Akkul, Mustafa ; Roberts, Michael ; Walker, Vanessa ; Bosch, Wolfgang
Author_Institution :
Filtronic plc., Shipley, UK
Abstract :
The design and measured results of Class-F output and input circuits for high efficiency operation of power amplifiers is presented. With the circuits presented in this paper, drain efficiencies of 85% can be obtained if the 2nd and 3rd harmonics are controlled. Efficiencies rise to 95% if the 4th and 5th harmonics are also controlled. A Class-F input circuit proposed to overcome the negative effects on PAE and efficiency caused by input capacitance variation. By shaping the input waveform the Class-F circuit creates a 50% duty cycle which prevents excessive power dissipation on the gate resistance, hence preventing gain and PAE degradation. A 15 W power amplifier designed at 1.8 GHz was fabricated to validate the presented techniques. The amplifier was designed utilising a FCSL (Filtronic Compound Semiconductors Ltd.) pHEMT device with a total gate periphery of 24 mm. With an unmodulated carrier, 16 watts of output power at 76% drain efficiency and 16 dB small-signal gain was obtained. The amplifier delivered 5.2 watts with a PAE of 48% under EDGE modulation.
Keywords :
UHF power amplifiers; impedance matching; microwave power amplifiers; network topology; power HEMT; wireless LAN; 1.8 GHz; 15 W; 16 W; 24 mm; 5.2 W; Filtronic Compound Semiconductors Limited; PAE; WLAN applications; base station applications; class F output circuits; drain efficiencies; duty cycle; edge modulation; fifth harmonics control; fourth harmonics control; gate periphery; gate resistance; high efficiency power amplifier; input capacitance variation; input waveform shaping; input-output circuit topologies; pHEMT device; power added efficiency; power dissipation; second harmonics control; third harmonics control; unmodulated carrier; wireless local area networks; Base stations; Capacitance; Circuit topology; Degradation; High power amplifiers; Operational amplifiers; Power amplifiers; Power dissipation; Power measurement; Wireless LAN;
Conference_Titel :
Microwave Symposium Digest, 2004 IEEE MTT-S International
Print_ISBN :
0-7803-8331-1
DOI :
10.1109/MWSYM.2004.1339099