DocumentCode :
3494926
Title :
Some considerations of via stitching impact on parasitic coupling of RF multiports in multilayer packages and MCMs
Author :
Arnaudov, Radosvet G.
Author_Institution :
Dept. Microelectron., Tech. Univ. Sofia, Sofia, Bulgaria
fYear :
2012
fDate :
2-4 Oct. 2012
Firstpage :
123
Lastpage :
129
Abstract :
Electromagnetic cavity-resonance modes in parallel-plate planes of power and ground rectangular structures along with parasitic coupling between excitation RF multiports are investigated. Such structures are widely used in microwave multilayer packages, MCMs and could be the source of considerable electromagnetic interference (EMI). Effective methods should be applied for damping and elimination of the radiated fields, especially in small areas and volumes. The investigated three-layered LTCC microwave package (QFN-type) possesses two separate grounding planes on different levels, connected through multiple shielding vias. The estimation of the electromagnetic field distribution is conducted by full-wave analysis of the proposed cavity-resonance models and corresponding S-parameters are extracted. This paper also discusses the influence of matrixlike via grid distribution on the propagation constant and effective dielectric permittivity of exemplary structures in the frequency band of interest -10 to 30 GHz.
Keywords :
S-parameters; ceramic packaging; electromagnetic interference; integrated circuit interconnections; multilayers; permittivity; EMI; MCM; QFN-type; RF multiports; S-parameters; dielectric permittivity; electromagnetic cavity-resonance modes; electromagnetic field distribution; electromagnetic interference; frequency 10 GHz to 30 GHz; full-wave analysis; ground rectangular structures; grounding planes; microwave multilayer packages; parallel-plate planes; parasitic coupling; propagation constant; quad flat packs; shielding vias; three-layered LTCC microwave package; via grid distribution; via stitching; Cavity-resonance modes; MCM; QFN microwave packages; effective dielectric constant; electromagnetic interference (EMI); full-wave analysis; multilayer LTCC; propagation constant;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Actual Problems of Electronics Instrument Engineering (APEIE), 2012 11th International Conference on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4673-2842-5
Type :
conf
DOI :
10.1109/APEIE.2012.6629157
Filename :
6629157
Link To Document :
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