Analytic expressions for MOM calculation of capacitance matrix of two dimensional system of conductors and dielectrics having arbitrarily oriented boundaries

Author

Gazizov, Talgat R.

Author_Institution

Tomsk State Univ. of Control Syst. & Radioelectron., Russia

Volume

1

fYear

2001

fDate

2001

Firstpage

151

Abstract

In this paper, the calculation of the capacitance matrix of a two-dimensional system in a multilayered dielectric medium (when there are dielectric-to-dielectric boundaries orthogonal to the Y axis only) over a ground plane is extended to cases when there are dielectric-to-dielectric boundaries: orthogonal to Y axis and X axis only; of arbitrary orientation. Complete derivation of final analytical formulae for elements of the S_matrix for the calculation of a capacitance matrix of two-dimensional system of conductors and dielectrics is presented. For extension of the calculation to the case without ground plane the approach of S.M. Rao et al. (1984). is used

Keywords

S-matrix theory; capacitance; conductors (electric); dielectric materials; electromagnetic compatibility; method of moments; EMC; S_ matrix; arbitrarily oriented boundaries; capacitance matrix; conductors; dielectric-to-dielectric boundaries; ground plane; method of moments; two-dimensional conductor/multilayered dielectric medium system; Capacitance; Conductors; Control systems; Dielectrics; Electromagnetic compatibility; Equations; Message-oriented middleware; Moment methods; Polarization; Radio control;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on

Conference_Location

Montreal, Que.

Print_ISBN

0-7803-6569-0

Type

conf

DOI

10.1109/ISEMC.2001.950576

Filename

950576