• DocumentCode
    349532
  • Title

    Simulation of plasma-immersed implantation of trenches

  • Author

    Paulus, M. ; Rauschenbach, B. ; Stals, L. ; Rüde, U.

  • Author_Institution
    Inst. fur Phys., Augsburg Univ., Germany
  • Volume
    2
  • fYear
    1999
  • fDate
    36495
  • Firstpage
    1187
  • Abstract
    The results of a particle-in-cell simulation for the plasma system in the plasma immersion ion implantation context is presented. PIII of two-dimensional trenches is studied using this simulation. Modeling of the potential around the trenches and the development of the plasma sheath in dependence on the pulse time is demonstrated. The implanted concentration, the average impact ion angle and the ion energy are computed as function of the pulse time and discussed in dependence on the aspect ratios of trenches
  • Keywords
    ion implantation; plasma materials processing; plasma sheaths; plasma simulation; semiconductor doping; impact ion angle; implanted concentration; ion energy; particle-in-cell simulation; plasma immersion ion implantation; plasma sheath; pulse time dependence; trench aspect ratios; two-dimensional trenches; Context modeling; Electrons; Ion implantation; Numerical models; Plasma density; Plasma immersion ion implantation; Plasma sheaths; Plasma simulation; Plasma temperature; Poisson equations;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Ion Implantation Technology Proceedings, 1998 International Conference on
  • Conference_Location
    Kyoto
  • Print_ISBN
    0-7803-4538-X
  • Type

    conf

  • DOI
    10.1109/IIT.1998.813896
  • Filename
    813896