• DocumentCode
    3495363
  • Title

    Integrating de-duplication and write for increased performance and endurance of Solid-State Drives

  • Author

    Berman, Amit ; Birk, Yitzhak

  • Author_Institution
    Electr. Eng. Dept., Technion - Israel Inst. of Technol., Haifa, Israel
  • fYear
    2010
  • fDate
    17-20 Nov. 2010
  • Abstract
    Modern NAND Flash-based Solid-State Drives (SSD) presents low latency, high throughput, low power consumption and solid-state reliability improvements comparing to traditional magnetic-disk based Hard Disk Drives (HDD). However, due to NAND Flash memory cell characteristics, update-in-place is impossible. Instead, the Flash software layer allocates new storage space whenever data is written, even if it is a slightly modified version of already stored data, e.g., a slightly modified file. Consequently, a logical overwrite entails extensive writing with resulting latency, power and chip endurance costs. Noting that reads are much faster than writes and that stale (“overwritten”) data is seldom erased until a much later time, we present an SSD architecture with integrated de-duplication at the Flash software layer. Our concept is to use de-duplication tools to manage write and read operations in SSD so as to reduce redundant writes caused by data overwrite. Read operation incur a penalty in order to reconstruct the stored data from multiple data versions. Our proposed architecture´s benefit grows in multi-block writes and in write-mostly applications. It moreover offers the side benefit of incremental backup, which enables to restore previous versions of the stored data.
  • Keywords
    NAND circuits; circuit reliability; flash memories; low-power electronics; Flash software layer; NAND flash-based solid-state drives; data overwriting; integrating deduplication; low-power consumption; read operation; solid-state reliability; write operation; Computer architecture; Flash memory; Indexes; Microprocessors; Performance evaluation; Software; Writing; Architecture; De-Duplication; Endurance; NAND Flash memory; Performance; Solid-State Drive;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel (IEEEI), 2010 IEEE 26th Convention of
  • Conference_Location
    Eliat
  • Print_ISBN
    978-1-4244-8681-6
  • Type

    conf

  • DOI
    10.1109/EEEI.2010.5662097
  • Filename
    5662097