Title :
A new radio disturbance measuring apparatus for asynchronous slip-ring machines
Author :
Alonso, A.M. ; Blázquez, F. ; Moreno, J. ; Álvarez, M.
Author_Institution :
E.T.S.I. Industriale, UPM, Madrid, Spain
Abstract :
IEC 60034-1 Ed 10.2 1999-08 -states in Section 12-Electromagnetic Compatibility (EMC) the limits for the conducted disturbance on AC supply terminals of asynchronous machines with slip-rings. CISPR standards describe the radio disturbance apparatus and methods for measurement of conducted disturbances, but this equipment seems not to be suitable for electrical machines with slip-rings in which the disturbances are originated by sparks in brush-ring contact. Our studies on spark-produced disturbances have led to the development of a continuous monitoring of sparking level device. From this device we have a new radio disturbance measuring apparatus, containing 5 modules: close magnetic field probe, conversion block, totalization and recording block, data management and final storage, data display. Extensive tests have been carried out with this device and a good agreement between the observed sparking level and the apparatus indication has been confirmed
Keywords :
IEC standards; asynchronous machines; computerised instrumentation; computerised monitoring; electric noise measurement; electromagnetic compatibility; magnetic sensors; radiofrequency interference; sparks; AC supply terminals; CISPR standards; EEC 60034-1 Ed 10.2 1999-08; EMC; asynchronous slip-ring machines; brush-ring contact; close magnetic field probe; conducted disturbances; continuous monitoring; conversion block; data display; data management; data storage; electromagnetic compatibility; radio disturbance measuring apparatus; recording block; spark-produced disturbances; sparking level device; totalization block; Contacts; Electric variables measurement; Electromagnetic compatibility; IEC standards; Magnetic field measurement; Magnetic recording; Measurement standards; Monitoring; Probes; Sparks;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950594
