Title :
A new protocol test sequence generation method based on UIOS
Author :
Yu, Shwuhwa S. ; Liu, Ming T.
Author_Institution :
Dept. of Comput. & Inf. Sci., Ohio State Univ., Columbus, OH, USA
Abstract :
The authors propose a novel method for test sequence generation based on UIOS which only needs a minimal verification part. They also prove that the UIOv method (or revised unique input/output method) has the same applicability as the characteristic set method. The UIOv method can find a test sequence for any minimal finite-state machine. The proposed method has the same applicability as the UIOv method. In addition, the method uses a simple test on a given protocol specification to decide whether a verification part is needed for detecting transfer faults, the method can generate a minimal number of input/output sequences for a verification part. A more efficient algorithm for generating UIOSs and signature sets is presented. It is proven that the upper bound on the length of a UIOS is (n-1)×n rather than nn, where n is the number of states in a finite-state machine
Keywords :
conformance testing; formal verification; protocols; UIOS; UIOv method; algorithm; conformance testing; minimal finite-state machine; protocol test sequence generation method; revised unique input/output method; signature sets; unique input/output sequences; Automata; Contracts; Fault detection; Information science; Magnetic heads; Performance evaluation; Protocols; Tail; Testing; Upper bound;
Conference_Titel :
INFOCOM '92. Eleventh Annual Joint Conference of the IEEE Computer and Communications Societies, IEEE
Conference_Location :
Florence
Print_ISBN :
0-7803-0602-3
DOI :
10.1109/INFCOM.1992.263479