• DocumentCode
    3495906
  • Title

    Analysis of ESD effect due to nonlinearity of metallic enclosures

  • Author

    Fung, L.C. ; Leung, S.W. ; Chan, K.H.

  • Author_Institution
    Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
  • Volume
    2
  • fYear
    2001
  • fDate
    2001
  • Firstpage
    1260
  • Abstract
    Electrostatic discharge (ESD) is a problem in electromagnetic compatibility (EMC) that can lead to serious interruption of digital PCB circuit performance. This paper presents an analysis of the noise induced in the digital circuit and characterizes the ESD effect as the nonlinear magnetic saturation property of metallic enclosures. The current distribution of the metallic enclosures is first evaluated, and the noise voltage induced in the PCB within the enclosed space is then estimated
  • Keywords
    digital circuits; electromagnetic compatibility; electrostatic discharge; finite difference time-domain analysis; printed circuits; 3D-FDTD; EMC; ESD; Maxwell´s equations; current distribution; digital PCB circuit performance; digital circuit; induced noise analysis; metallic enclosures; nonlinear magnetic saturation; Circuit noise; Circuit optimization; Current distribution; Digital circuits; Electromagnetic compatibility; Electrostatic discharge; Magnetic analysis; Magnetic noise; Magnetic properties; Nonlinear magnetics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
  • Conference_Location
    Montreal, Que.
  • Print_ISBN
    0-7803-6569-0
  • Type

    conf

  • DOI
    10.1109/ISEMC.2001.950622
  • Filename
    950622