Title :
Analysis of ESD effect due to nonlinearity of metallic enclosures
Author :
Fung, L.C. ; Leung, S.W. ; Chan, K.H.
Author_Institution :
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Abstract :
Electrostatic discharge (ESD) is a problem in electromagnetic compatibility (EMC) that can lead to serious interruption of digital PCB circuit performance. This paper presents an analysis of the noise induced in the digital circuit and characterizes the ESD effect as the nonlinear magnetic saturation property of metallic enclosures. The current distribution of the metallic enclosures is first evaluated, and the noise voltage induced in the PCB within the enclosed space is then estimated
Keywords :
digital circuits; electromagnetic compatibility; electrostatic discharge; finite difference time-domain analysis; printed circuits; 3D-FDTD; EMC; ESD; Maxwell´s equations; current distribution; digital PCB circuit performance; digital circuit; induced noise analysis; metallic enclosures; nonlinear magnetic saturation; Circuit noise; Circuit optimization; Current distribution; Digital circuits; Electromagnetic compatibility; Electrostatic discharge; Magnetic analysis; Magnetic noise; Magnetic properties; Nonlinear magnetics;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950622
