DocumentCode
3495906
Title
Analysis of ESD effect due to nonlinearity of metallic enclosures
Author
Fung, L.C. ; Leung, S.W. ; Chan, K.H.
Author_Institution
Dept. of Electron. Eng., City Univ. of Hong Kong, Kowloon, China
Volume
2
fYear
2001
fDate
2001
Firstpage
1260
Abstract
Electrostatic discharge (ESD) is a problem in electromagnetic compatibility (EMC) that can lead to serious interruption of digital PCB circuit performance. This paper presents an analysis of the noise induced in the digital circuit and characterizes the ESD effect as the nonlinear magnetic saturation property of metallic enclosures. The current distribution of the metallic enclosures is first evaluated, and the noise voltage induced in the PCB within the enclosed space is then estimated
Keywords
digital circuits; electromagnetic compatibility; electrostatic discharge; finite difference time-domain analysis; printed circuits; 3D-FDTD; EMC; ESD; Maxwell´s equations; current distribution; digital PCB circuit performance; digital circuit; induced noise analysis; metallic enclosures; nonlinear magnetic saturation; Circuit noise; Circuit optimization; Current distribution; Digital circuits; Electromagnetic compatibility; Electrostatic discharge; Magnetic analysis; Magnetic noise; Magnetic properties; Nonlinear magnetics;
fLanguage
English
Publisher
ieee
Conference_Titel
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location
Montreal, Que.
Print_ISBN
0-7803-6569-0
Type
conf
DOI
10.1109/ISEMC.2001.950622
Filename
950622
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