DocumentCode
3495911
Title
Adapted importance sampling schemes for the simulation of dependability models of fault-tolerant systems with deferred repair
Author
Carrasco, Juan A.
Author_Institution
Departament d´´ Enginyeria Electronica, Univ. Politecnica de Catalunya, Barcelona, Spain
fYear
2006
fDate
2-6 April 2006
Abstract
This paper targets the simulation of continuous-time Markov chain models of fault-tolerant systems with deferred repair. We start by stating sufficient conditions for a given importance sampling scheme to satisfy the bounded relative error property. Using those sufficient conditions, it is noted that many previously proposed importance sampling techniques such as failure biasing and balanced failure biasing satisfy that property. Then, we adapt the importance sampling schemes failure transition distance biasing and balanced failure transition distance biasing so as to develop new importance sampling schemes which can be implemented with moderate effort and at the same time can be proved to be more efficient for balanced systems than the simpler failure biasing and balanced failure biasing schemes. The increased efficiency for both balanced and unbalanced systems of the new adapted importance sampling schemes is illustrated using examples.
Keywords
Markov processes; fault tolerant computing; importance sampling; adapted importance sampling; balanced failure biasing; balanced failure transition distance biasing; balanced system; bounded relative error property; continuous-time Markov chain model simulation; deferred repair; fault-tolerant system; Discrete event simulation; Explosions; Fault tolerant systems; Measurement standards; Monte Carlo methods; Numerical analysis; Robustness; Sampling methods; State-space methods; Sufficient conditions;
fLanguage
English
Publisher
ieee
Conference_Titel
Simulation Symposium, 2006. 39th Annual
ISSN
1080-241X
Print_ISBN
0-7695-2559-8
Type
conf
DOI
10.1109/ANSS.2006.10
Filename
1612850
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