• DocumentCode
    3495912
  • Title

    An Engineering Approach for Bayes Reliability Assessment of Avionic Device

  • Author

    Yin Zong-run ; Mu Xiao-dong ; Zhao Peng

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Xi´an Res. Inst. of Hi-Tech Hongqing Town, Xian
  • Volume
    1
  • fYear
    2009
  • fDate
    7-8 March 2009
  • Firstpage
    349
  • Lastpage
    351
  • Abstract
    This paper studies the computation problem of Bayesian method in reliability assessment of avionic device, an engineering approach for Bayesian reliability analysis in the 2-parameter Weibull distribution is proposed to the issue. The prior distribution of failure probability is built according to the engineering experiences, based on the distribution, this approach allows constructing the joint prior distribution of Weibull parameters through random sampling as well as ascertaining the prior estimates of the mean and standard deviation at any given point, then random sampling is adopted again to obtain the joint posterior distribution of the parameters. A practical example is given as an illustration. Result shows that, this approach can simplify computation in practical applications, and it provides great reference values for later use.
  • Keywords
    Bayes methods; Weibull distribution; avionics; reliability; 2-parameter Weibull distribution; Bayes reliability assessment; Bayesian method; Bayesian reliability analysis; Weibull parameters; avionic device; failure probability; joint posterior distribution; random sampling; Aerospace electronics; Bayesian methods; Computer science; Educational technology; Electronic equipment; Electronic equipment testing; Reliability engineering; Sampling methods; Shape; Weibull distribution; Bayesian method; Weibull distribution; joint distribution; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Education Technology and Computer Science, 2009. ETCS '09. First International Workshop on
  • Conference_Location
    Wuhan, Hubei
  • Print_ISBN
    978-1-4244-3581-4
  • Type

    conf

  • DOI
    10.1109/ETCS.2009.87
  • Filename
    4958790