DocumentCode :
3496166
Title :
Multiple object decomposition based on independent component analysis of multi-energy x-ray projections
Author :
Kang, Dong-Goo ; Sung, Younghun ; Kim, SungSu ; Lee, SeongDeok ; Kim, Changyeong
Author_Institution :
Samsung Adv. Inst. of Technol., Samsung Electron., Yongin, South Korea
fYear :
2009
fDate :
7-10 Nov. 2009
Firstpage :
4173
Lastpage :
4176
Abstract :
X-ray projection is not effective for representing complex overlapping objects. This paper presents a novel computational framework to decompose X-ray projections into multiple images with non-overlapping objects that are differentiated by their own material compositions. Based on energy-dependent X-ray attenuation characteristics for each material, multiple energy X-ray images are analyzed to obtain material-selective images, which correspond to projections of basis materials that constitute objects. We show that material-selective images can be considered as linear mixtures of independent components that are associated with object-selective images. As a result, multiple objects can be decomposed by independent component analysis (ICA) of material-selective images or ICA of multiple monochromatic energy X-ray images. To demonstrate the concept of the proposed method, we apply it to simulated images based on a 3-D human model.
Keywords :
X-ray imaging; X-ray monochromators; medical image processing; 3D human model; ICA; complex overlapping objects; energy dependent X-ray attenuation; independent component analysis; material selective images; multienergy x-ray projections; multiple energy X-ray images; multiple monochromatic energy X-ray images; multiple object decomposition; Cancer; Image texture analysis; Independent component analysis; Malignant tumors; Nakagami distribution; Neoplasms; Pixel; Probability density function; Radio frequency; Ultrasonic imaging; Multi-energy X-ray imaging; independent component analysis; object decomposition;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Image Processing (ICIP), 2009 16th IEEE International Conference on
Conference_Location :
Cairo
ISSN :
1522-4880
Print_ISBN :
978-1-4244-5653-6
Electronic_ISBN :
1522-4880
Type :
conf
DOI :
10.1109/ICIP.2009.5414533
Filename :
5414533
Link To Document :
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