• DocumentCode
    3496472
  • Title

    Novel T/R switch architectures for MIMO applications

  • Author

    Lee, Chang-Ho ; Banerjee, Bhaskar ; Laskar, Joy

  • Author_Institution
    Georgia Electron. Design Center, Georgia Inst. of Technol., Atlanta, GA, USA
  • Volume
    2
  • fYear
    2004
  • fDate
    6-11 June 2004
  • Firstpage
    1137
  • Abstract
    In this paper, we present new architectures for three kinds of RF switches (DPDT, DP4T, 4P4T) with very simple control logics and high power handling capabilities. Implementation of DPDT, DP4T, and 4P4T switch matrix for multi-input-multi-output (MIMO) applications is demonstrated with measurements. The suggested DPDT, DP4T, and 4P4T switch architectures require only one, two and three control lines, respectively, regardless of semiconductor technology. The developed DPDT switch demonstrates 1.0 dB of insertion loss, 19 dB of isolation, and 31 dBm of input P0.1 dB, 34.5 dBm of input P1 dB in 3/0 V operation at 5.8 GHz. The DP4T, 4P4T switches exhibit 1.8 dB, 2.8 dB of insertion loss, and 23/37 dB, 20/35/55 dB of isolation, respectively, and 31 dBm of input P0.1 dB, 35 dBm of input P1 dB in 3/0 V operation at 5.8 GHz. The MMICs are developed in a commercial 0.25-μm GaAs pHEMT process. These switch architectures are preferable for the Si-based processes because the substrate vias are not required due to their generic topologies. To the best of our knowledge, this is the first report on the simple architectures for RF switch matrix for MIMO applications.
  • Keywords
    III-V semiconductors; MIMO systems; field effect transistor switches; gallium arsenide; microwave switches; power HEMT; semiconductor device models; 0.25 micron; 1.0 dB; 1.8 dB; 19 dB; 2.8 dB; 5.8 GHz; GaAs; MIMO applications; MMIC; RF switch matrix; Si-based processes; control logics; generic topologies; insertion loss; monolithic microwave integrated circuit; multi input multi output; pHEMT process; power handling capabilities; power high electron mobility transistor; semiconductor technology; switch architectures; Gallium arsenide; Insertion loss; Isolation technology; Logic; MIMO; MMICs; PHEMTs; Power semiconductor switches; Radio frequency; Substrates;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Symposium Digest, 2004 IEEE MTT-S International
  • ISSN
    0149-645X
  • Print_ISBN
    0-7803-8331-1
  • Type

    conf

  • DOI
    10.1109/MWSYM.2004.1339186
  • Filename
    1339186