Title :
Mechanical strengthening of silicon torsion bar of MEMS scanning mirror by hydrogen anneal
Author :
Hajika, R. ; Yoshida, Sigeru ; Makishi, W. ; Kanamori, Yoshiaki ; Tanaka, Shoji ; Esashi, Masayoshi
Author_Institution :
Grad. Sch. of Eng., Tohoku Univ., Sendai, Japan
Abstract :
This paper reports on the strengthening effect of hydrogen anneal on torsional fracture strength of single crystal silicon (SCS). Moving-magnet-type MEMS mirrors were prepared by fabricating SCS and silicon on insulator (SOI) wafers via deep reactive ion etching (DRIE) as fracture test specimens. As a result of the fracture test of the torsion bar on the mirrors, the torsion bar fabricated using a SCS wafer could be strengthened to about 4 times in average by hydrogen anneal. By contrast, that using a SOI wafer was weaken to half. This mechanical strengthening effect has the potential ability to provide highly-reliable and tough SCS-based MEMS devices.
Keywords :
annealing; elemental semiconductors; fracture toughness; mechanical strength; micro-optomechanical devices; microfabrication; micromirrors; reliability; silicon; silicon-on-insulator; sputter etching; DRIE; MEMS scanning mirror; SCS wafer fabrication; SCS-based MEMS devices; SOI wafer fabrication; Si; deep reactive ion etching; fracture test specimens; hydrogen anneal; mechanical strengthening effect; moving-magnet-type MEMS mirrors; reliability; silicon torsion bar; single-crystal silicon; torsion bar fabrication; torsional fracture strength; Annealing; Etching; Hydrogen; Micromechanical devices; Mirrors; Silicon;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-5654-1
DOI :
10.1109/MEMSYS.2013.6474269