DocumentCode :
3496753
Title :
Reliability evaluation for specify factor of fatigue on power device
Author :
Kobayshi, M. ; Yu, Qiang
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Yokohama, Japan
fYear :
2010
fDate :
12-14 Jan. 2010
Firstpage :
1
Lastpage :
6
Abstract :
This paper presents a fundamental method to evaluate thermal fatigue life of power module. Coupled electrical-thermal analysis is performed to obtain the distribution of temperature due to electric current. Then, thermo-mechanical analysis is carried out to calculate inelastic, aluminum wire bonding was done. Crack path simulation technique was used to evaluate total fatigue life of solder joint and resultant temperature increase. The fatigue life of aluminum wire bonding was estimated by the same model and similar approach. The crack at the center of the solder layer below aluminum wire bonding. The the maximum temperature in the solder grows up of crack propagation. Therefore, the fatigue life of aluminum wire bonding deteriorates. That is to say, this study is comparison between the fatigue life of solder joint and aluminum wire bonding for evaluate total life of the power module.
Keywords :
fatigue cracks; lead bonding; power semiconductor devices; reliability; solders; thermal analysis; thermal stress cracking; coupled electrical-thermal analysis; crack path simulation; crack propagation; inelastic aluminum wire bonding; power device; reliability evaluation; solder joint; solder layer; thermal fatigue life; thermomechanical analysis; total fatigue life; Aluminum; Bonding; Couplings; Current; Fatigue; Multichip modules; Performance analysis; Soldering; Temperature distribution; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Prognostics and Health Management Conference, 2010. PHM '10.
Conference_Location :
Macao
Print_ISBN :
978-1-4244-4756-5
Electronic_ISBN :
978-1-4244-4758-9
Type :
conf
DOI :
10.1109/PHM.2010.5414564
Filename :
5414564
Link To Document :
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