Title :
Reduction of the number of tests by coupling together the sequential and the Bayesian method
Author :
Guerin, Fabrice ; Dumon, Bernard
Author_Institution :
ISTIA, Angers, France
Abstract :
We recommend a method which enables us to reduce the number of tests undertaken according to the sequential method. To achieve this, we take into account the opinion of experts who take a view on the likely value of the sought parameter and its dispersion. Thus, by using the Bayes theorem (with 2 parameters), we can merge these data with the ones obtained during tests on the new product, and reduce therefore the number of tests
Keywords :
Bayes methods; gamma distribution; normal distribution; parameter estimation; reliability theory; Bayesian method; new product tests; sequential method; Bayesian methods; Costs; Gaussian distribution; Parameter estimation; Performance evaluation; Sequential analysis; Stress; System testing;
Conference_Titel :
Systems, Man, and Cybernetics, 1999. IEEE SMC '99 Conference Proceedings. 1999 IEEE International Conference on
Conference_Location :
Tokyo
Print_ISBN :
0-7803-5731-0
DOI :
10.1109/ICSMC.1999.814221
