DocumentCode :
3496791
Title :
The photocurrent of resonant tunneling diode controlled by the charging effects of quantum dots
Author :
Zhou, Daming ; Weng, Qianchun ; Wang, Wangping ; Li, Ning ; Zhang, Bo ; Chen, Xiaoshuang ; Lu, Wei ; Wang, Wenxin ; Chen, Hong
Author_Institution :
Nat. Lab. for Infrared Phys., Shanghai Inst. of Tech. Phys., Shanghai, China
fYear :
2012
fDate :
28-31 Aug. 2012
Firstpage :
49
Lastpage :
50
Abstract :
We experimentally studied the photocurrent of AlAs/GaAs/AlAs double barrier resonant tunneling diode (RTD), which is composed of an InAs layer of self-assembled quantum-dots (QDs) on top of the AlAs barrier layer. It is found that the charging InAs quantum dots can effectively modulate the carrier transport properties of the RTD. Moreover, we also found that the resonant tunneling current through a single energy level of an individual quantum dot is extremely sensitive to the photo-excited holes bound nearby the dot, and the presence of the holes lowers the electrostatic energy of the quantum dot state. In addition, it is also observed that the photocurrent can increase step by step with the individual photon pulse excitation when the illumination is low enough. The experiment results well demonstrated the quantum amplified characteristics of the device.
Keywords :
III-V semiconductors; aluminium compounds; gallium arsenide; indium compounds; photoconductivity; resonant tunnelling diodes; self-assembly; semiconductor quantum dots; InAs-AlAs-GaAs-AlAs; RTD; barrier layer; carrier transport properties; charging effects; double barrier resonant tunneling diode; electrostatic energy; photocurrent; photoexcited holes; photon pulse excitation; quantum amplified characteristics; quantum dot state; resonant tunneling current; self-assembled quantum-dots; single energy level; Gallium arsenide; Lighting; Photoconductivity; Photonics; Quantum dot lasers; Quantum dots; Resonant tunneling devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Numerical Simulation of Optoelectronic Devices (NUSOD), 2012 12th International Conference on
Conference_Location :
Shanghai
ISSN :
2158-3234
Print_ISBN :
978-1-4673-1602-6
Type :
conf
DOI :
10.1109/NUSOD.2012.6316501
Filename :
6316501
Link To Document :
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