Title :
Suspended CNT-FET piezoresistive strain gauges: Chirality assignment and quantitative analysis
Author :
Muoth, M. ; Chikkadi, K. ; Yu Liu ; Hierold, C.
Author_Institution :
Dept. of Mech. & Process Eng., ETH Zurich, Zurich, Switzerland
Abstract :
Carbon nanotubes can withstand large elastic deformation and show pronounced piezoresistive effects which make them promising candidates for low-power strain sensors in the large strain regime. Integration of individual suspended nanotubes into complex microelectromechanical devices, including gate structures, is still a challenge. Here, ultraclean carbon nanotubes spanning across actuated MEMS electrodes are operated as suspended Carbon Nanotube Field-Effect Transistors (CNT-FETs) under repeated variable strain up to 4.5%, thus acting as small-sized piezoresistive strain gauges whose gauge factor is electrostatically tuned by the gate. We present the first quantified electromechanical analysis of suspended CNT-FETs to uniaxial strain applied by on-chip micro actuators.
Keywords :
carbon nanotube field effect transistors; chirality; microactuators; microelectrodes; microsensors; piezoresistive devices; strain gauges; strain sensors; C; actuated MEMS electrode; chirality assignment; gate structure; gauge factor; low power strain sensor; microelectromechanical device; on-chip microactuator; piezoresistive effect; piezoresistive strain gauge; quantitative analysis; suspended CNT-FET; suspended carbon nanotube field-effect transistors; ultraclean carbon nanotubes; Actuators; Carbon nanotubes; Diffraction; Logic gates; Sensors; Strain;
Conference_Titel :
Micro Electro Mechanical Systems (MEMS), 2013 IEEE 26th International Conference on
Conference_Location :
Taipei
Print_ISBN :
978-1-4673-5654-1
DOI :
10.1109/MEMSYS.2013.6474287