DocumentCode :
3496936
Title :
Nonlinear distortion voltage testing of contact surfaces
Author :
Minowa, Isao ; Kanno, Makoto
Author_Institution :
Fac. of Eng., Tamagawa Univ., Machida, Japan
fYear :
1988
fDate :
26-29 Sept. 1988
Firstpage :
277
Lastpage :
280
Abstract :
Contact resistance, second-order distortion voltages, and DC vias voltages, which minimize distortion, are measured on a copper surface for studying surface film conditions. Platinum contact members to a copper rod and a polished surface of a single copper crystal are tested. The results are statistically indicated and shown with histograms in order to compare the contact resistance to the DC bias voltage. The results, obtained using a dual-frequency method and DC source, suggest that the second-order distortion (result of rectification) would be caused by a potential difference (difference of work functions of the contact metals) through layers, since the second-order distortion is strongly influenced by a DC bias voltage and approaches zero at a characteristic value for the combination of metals.<>
Keywords :
contact resistance; electric distortion measurement; electrical contacts; materials testing; Cu surface; DC vias voltages; Pt-Cu contacts; combination of metals; contact resistance; difference of work functions; dual-frequency method; histograms; nonlinear distortion voltage testing; rectification; second order distortion; second-order distortion voltages; single crystal Cu; surface film conditions; testing of contact surfaces; third order distortion; Contact resistance; Copper; Distortion measurement; Electrical resistance measurement; Histograms; Nonlinear distortion; Platinum; Surface resistance; Testing; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on
Conference_Location :
San Francisco, CA, USA
Type :
conf
DOI :
10.1109/HOLM.1988.16129
Filename :
16129
Link To Document :
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