• DocumentCode
    3496946
  • Title

    A 40 nm 0.32 V 3.5 MHz 11T single-ended bit-interleaving subthreshold SRAM with data-aware write-assist

  • Author

    Yi-Wei Chiu ; Yu-Hao Hu ; Ming-Hsien Tu ; Jun-Kai Zhao ; Shyh-Jye Jou ; Ching-Te Chuang

  • Author_Institution
    Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    51
  • Lastpage
    56
  • Abstract
    This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for VDD down to 0.32 V (~0.69X of threshold voltage) with VDDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 μW (27.2 μW) at 25 °C.
  • Keywords
    CMOS memory circuits; SRAM chips; integrated circuit design; DAPC write-assist; bit-interleaving 11T subthreshold SRAM cell; data-aware power-cutoff; frequency 16.5 MHz; frequency 3.5 MHz; general purpose CMOS technology; memory size 4 KByte; power 15.2 muW; power 27.2 muW; size 100 nm; size 40 nm; temperature 25 degC; voltage 0.32 V; voltage 0.38 V; write ability threshold operation; Computer architecture; Digital audio players; Layout; MOS devices; Microprocessors; SRAM cells;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-1234-6
  • Type

    conf

  • DOI
    10.1109/ISLPED.2013.6629266
  • Filename
    6629266