Title : 
A 40 nm 0.32 V 3.5 MHz 11T single-ended bit-interleaving subthreshold SRAM with data-aware write-assist
         
        
            Author : 
Yi-Wei Chiu ; Yu-Hao Hu ; Ming-Hsien Tu ; Jun-Kai Zhao ; Shyh-Jye Jou ; Ching-Te Chuang
         
        
            Author_Institution : 
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
         
        
        
        
        
        
            Abstract : 
This paper presents a new bit-interleaving 11T subthreshold SRAM cell with Data-Aware Power-Cutoff (DAPC) Write-assist to mitigate the leakage and variation and improve the Write-ability in deep sub-100nm technology. Measurement results from a 4 Kb test chip implemented in 40 nm General Purpose (40GP) CMOS technology operates for VDD down to 0.32 V (~0.69X of threshold voltage) with VDDMIN limited by Read operation. The measured maximum operation frequency is 3.5 MHz (16.5 MHz) at 0.32 V (0.38 V) with total power consumption of 15.2 μW (27.2 μW) at 25 °C.
         
        
            Keywords : 
CMOS memory circuits; SRAM chips; integrated circuit design; DAPC write-assist; bit-interleaving 11T subthreshold SRAM cell; data-aware power-cutoff; frequency 16.5 MHz; frequency 3.5 MHz; general purpose CMOS technology; memory size 4 KByte; power 15.2 muW; power 27.2 muW; size 100 nm; size 40 nm; temperature 25 degC; voltage 0.32 V; voltage 0.38 V; write ability threshold operation; Computer architecture; Digital audio players; Layout; MOS devices; Microprocessors; SRAM cells;
         
        
        
        
            Conference_Titel : 
Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
         
        
            Conference_Location : 
Beijing
         
        
            Print_ISBN : 
978-1-4799-1234-6
         
        
        
            DOI : 
10.1109/ISLPED.2013.6629266