Title :
High-performance pseudomorphic power HEMTs for low-voltage wireless communication applications
Author :
Yeong-Lin Lai ; Chang, Edward Y. ; Chun-Yen Chang ; Liu, T.H. ; Wang, S.P.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
A high-performance pseudomorphic high electron mobility transistor (HEMT) with high output power density and high power-added efficiency for low-voltage wireless communication applications has been developed. This paper describes the dc and microwave performance of the pseudomorphic AlGaAs-InGaAs HEMT developed. The 1 um gate-length HEMT exhibited a maximum drain current of 470 mA/mm at Vgs=+1.0 V. The maximum transconductance of the device was 280 mS/mm. At a drain bias of 3.0 V and a measurement frequency of 900 MHz, the 2 mm-wide HEMT demonstrated an output power of 26.1 dBm (a power density of 204 mW/mm) and a power-added efficiency of 65% under the class AB condition while an output power of 26.7 dBm (234 mW/mm) and a power-added efficiency of 60% were obtained under the class A condition. The developed pseudomorphic power HEMT developed achieves the highest output power density ever reported among the GaAs devices operating at 3.0 V
Keywords :
III-V semiconductors; UHF field effect transistors; UHF measurement; aluminium compounds; gallium arsenide; indium compounds; power HEMT; power field effect transistors; 1.0 V; 3.0 V; 60 percent; 65 percent; 900 MHz; AlGaAs-InGaAs; UHF power FETs; class A condition; class AB condition; drain bias; drain current; gate length; low-voltage wireless communication; measurement frequency; output power density; power-added efficiency; pseudomorphic power HEMTs; Density measurement; Electron mobility; HEMTs; MODFETs; Microwave devices; Microwave transistors; PHEMTs; Power generation; Transconductance; Wireless communication;
Conference_Titel :
Semiconductor Electronics, 1996. ICSE '96. Proceedings., 1996 IEEE International Conference on
Conference_Location :
Penang
Print_ISBN :
0-7803-3388-8
DOI :
10.1109/SMELEC.1996.616487