Title :
The bridging effect of the isolation moat on the EMI caused by ground bounce noise between power/ground planes of PCB
Author :
Hwang, Jiunn-Nan ; Wu, Tzong-Lin
Author_Institution :
Dept. of Electr. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
Based on the FDTD modeling approach, the bridging effect of the isolation moat on the EMI caused by ground bounce noise is investigated. We find that isolating the noise source by the slits (or moats) is effective to eliminate the EMI, but bridges connecting between two sides of the slits will significantly degrade the effect of EMI protection. The measured and modeled results of the EMI strength at 3 m are compared and they are quite consistent
Keywords :
electromagnetic interference; finite difference time-domain analysis; printed circuits; 3 m; EMI; EMI protection; EMI strength; FDTD modeling; PCB; bridging effect; ground bounce noise; isolation moat; noise source isolation; power/ground planes; Bridge circuits; Circuit noise; Digital circuits; Electromagnetic compatibility; Electromagnetic interference; Etching; Finite difference methods; Joining processes; Resonant frequency; Time domain analysis;
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
DOI :
10.1109/ISEMC.2001.950686
