• DocumentCode
    3497166
  • Title

    Clustering di-graphs for continuously verifying users according to their typing patterns

  • Author

    Shimshon, Tomer ; Moskovitch, Robert ; Rokach, Lior ; Elovici, Yuval

  • Author_Institution
    Dept. of Inf. Syst. Eng., Ben Gurion Univ., Beer-Sheva, Israel
  • fYear
    2010
  • fDate
    17-20 Nov. 2010
  • Abstract
    Traditionally users are authenticated based on a username and password. However, a logged station is still vulnerable to imposters when the user leaves her computer without logging off. Keystroke dynamics methods can be useful to continuously verify a user, after the authentication process has successfully ended. Within the last decade several studies proposed the use of keystroke dynamics as a behavioral biometric tool to verify users. We propose a new method, for compactly representing the keystroke patterns by joining similar pairs of consecutive keystrokes. The proposed method considers clustering di-graphs based on their temporal features. The proposed method was evaluated on 10 legitimate users and 15 imposters. Encouraging results suggest that the proposed method detection performance is better than that of existing methods. Specifically we reach a False Acceptance Rate (FAR) of 0.41% and a False Rejection Rate (FRR) of 0.63%.
  • Keywords
    authorisation; biometrics (access control); directed graphs; message authentication; pattern clustering; authentication process; behavioral biometric tool; detection performance; digraph clustering; false acceptance rate; false rejection rate; keystroke dynamics; keystroke pattern; typing pattern; user verification; Classification algorithms; Electronic mail; Erbium; Feature extraction; Keyboards; Support vector machine classification; Training;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical and Electronics Engineers in Israel (IEEEI), 2010 IEEE 26th Convention of
  • Conference_Location
    Eliat
  • Print_ISBN
    978-1-4244-8681-6
  • Type

    conf

  • DOI
    10.1109/EEEI.2010.5662182
  • Filename
    5662182