Title : 
Analytical modeling of short-circuit energy dissipation in submicron CMOS structures
         
        
            Author : 
Bisdounis, L. ; Koufo, O.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Patras Univ., Greece
         
        
        
        
        
        
            Abstract : 
In this paper, an accurate analytical model for the short-circuit energy dissipation of CMOS logic structures, on the basis of a CMOS inverter, is presented. The derived model is based on analytical expressions of the inverter output waveform which include the influences of both transistor currents and the gate-to-drain coupling capacitance. Also, the effect of the short-circuiting transistor´s gate-source capacitance on the short-circuit energy dissipation, is taken into account. The α-power law MOS model which considers the carriers´ velocity saturation effect of submicron devices, is used. The results produced by the suggested model for a commercial 0.8 μm process show very good agreement with SPICE simulations (error less than 15% in most cases). After the extension of the inverter model to CMOS gates, the accuracy is maintained at the same level
         
        
            Keywords : 
CMOS logic circuits; capacitance; integrated circuit modelling; logic gates; short-circuit currents; α-power law MOS model; 0.8 micron; CMOS gates; CMOS inverter; CMOS logic structures; analytical modeling; carrier velocity saturation effect; gate-source capacitance; gate-to-drain coupling capacitance; inverter output waveform; short-circuit energy dissipation; submicron CMOS structures; transistor currents; Analytical models; Capacitance; Circuits; Electronic mail; Energy dissipation; Inverters; Laboratories; Power supplies; Semiconductor device modeling; Very large scale integration;
         
        
        
        
            Conference_Titel : 
Electronics, Circuits and Systems, 1999. Proceedings of ICECS '99. The 6th IEEE International Conference on
         
        
            Conference_Location : 
Pafos
         
        
            Print_ISBN : 
0-7803-5682-9
         
        
        
            DOI : 
10.1109/ICECS.1999.814495