• DocumentCode
    3497315
  • Title

    Steep switching tunnel FET: A promise to extend the energy efficient roadmap for post-CMOS digital and analog/RF applications

  • Author

    Huichu Liu ; Datta, Soupayan ; Narayanan, Vijaykrishnan

  • Author_Institution
    Electr. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA
  • fYear
    2013
  • fDate
    4-6 Sept. 2013
  • Firstpage
    145
  • Lastpage
    150
  • Abstract
    Steep switching Tunnel FETs (TFET) can extend the supply voltage scaling with improved energy efficiency for both digital and analog/RF application. In this paper, recent approaches on III-V Tunnel FET device design, prototype device demonstration, modeling techniques and performance evaluations for digital and analog/RF application are discussed and compared to CMOS technology. The impact of steep switching, uni-directional conduction and negative differential resistance characteristics are explored from circuit design perspective. Circuit-level implementation such as III-V TFET based Adder and SRAM design shows significant improvement on energy efficiency and power reduction below 0.3V for digital application. The analog/RF metric evaluation is presented including gm/Ids metric, temperature sensitivity, parasitic impact and noise performance. TFETs exhibit promising performance for high frequency, high sensitivity and ultra-low power RF rectifier application.
  • Keywords
    SRAM chips; adders; field effect transistors; low-power electronics; rectifiers; semiconductor device models; semiconductor device noise; tunnelling; CMOS technology; SRAM design; TFET based adder; circuit design perspective; circuit-level implementation; energy efficiency; negative differential resistance; noise performance; performance evaluation; post-CMOS digital and analog/RF applications; steep switching; supply voltage scaling; temperature sensitivity; tunnel FET device design; ultra-low power RF rectifier; CMOS integrated circuits; Energy efficiency; FinFETs; Logic gates; Radio frequency; Random access memory; Silicon; Steep switching; TFET SRAMs; Tunnel FETs; energy efficiency; low power analog/RF; supply voltage scaling; ultra-low power digital;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-1-4799-1234-6
  • Type

    conf

  • DOI
    10.1109/ISLPED.2013.6629285
  • Filename
    6629285