DocumentCode :
3497315
Title :
Steep switching tunnel FET: A promise to extend the energy efficient roadmap for post-CMOS digital and analog/RF applications
Author :
Huichu Liu ; Datta, Soupayan ; Narayanan, Vijaykrishnan
Author_Institution :
Electr. Eng. Dept., Pennsylvania State Univ., University Park, PA, USA
fYear :
2013
fDate :
4-6 Sept. 2013
Firstpage :
145
Lastpage :
150
Abstract :
Steep switching Tunnel FETs (TFET) can extend the supply voltage scaling with improved energy efficiency for both digital and analog/RF application. In this paper, recent approaches on III-V Tunnel FET device design, prototype device demonstration, modeling techniques and performance evaluations for digital and analog/RF application are discussed and compared to CMOS technology. The impact of steep switching, uni-directional conduction and negative differential resistance characteristics are explored from circuit design perspective. Circuit-level implementation such as III-V TFET based Adder and SRAM design shows significant improvement on energy efficiency and power reduction below 0.3V for digital application. The analog/RF metric evaluation is presented including gm/Ids metric, temperature sensitivity, parasitic impact and noise performance. TFETs exhibit promising performance for high frequency, high sensitivity and ultra-low power RF rectifier application.
Keywords :
SRAM chips; adders; field effect transistors; low-power electronics; rectifiers; semiconductor device models; semiconductor device noise; tunnelling; CMOS technology; SRAM design; TFET based adder; circuit design perspective; circuit-level implementation; energy efficiency; negative differential resistance; noise performance; performance evaluation; post-CMOS digital and analog/RF applications; steep switching; supply voltage scaling; temperature sensitivity; tunnel FET device design; ultra-low power RF rectifier; CMOS integrated circuits; Energy efficiency; FinFETs; Logic gates; Radio frequency; Random access memory; Silicon; Steep switching; TFET SRAMs; Tunnel FETs; energy efficiency; low power analog/RF; supply voltage scaling; ultra-low power digital;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-1234-6
Type :
conf
DOI :
10.1109/ISLPED.2013.6629285
Filename :
6629285
Link To Document :
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