DocumentCode :
3497328
Title :
Separated role of on-chip and on-PCB decoupling capacitors for reduction of radiated emission on printed circuit board
Author :
Kim, Jonghoon ; Choi, Baekkyu ; Kim, Hyungsoo ; Ryu, Woonghwan ; Yun, Young-hwan ; Ham, Seog-heon ; Soo-Hyung Kim ; Lee, Yong-Hee ; Joungho Kim
Author_Institution :
Div. of Electr. Eng., KAIST, Taejon, South Korea
Volume :
1
fYear :
2001
fDate :
2001
Firstpage :
531
Abstract :
The power/ground fluctuation is known as a significant source of radiated emission. We discuss the separated functions of on-PCB and on-chip decoupling capacitors on the suppression of electromagnetic radiated emission. Due to the different ranges of parasitic inductance and the different locations of the on-chip current drivers, on-PCB and on-chip decoupling capacitors exhibit separated frequency characteristics in terms of suppression efficiency of radiation. The roles of on-PCB and on-chip decoupling capacitors are estimated by circuit simulation and a simple antenna model, and are confirmed by experiments. It is found that the on-chip decoupling capacitors are mainly effective for the suppression of radiated emission over 100 MHz frequency. Increase of the on-chip decoupling capacitance and decrease of the parasitic inductance of the package produce an improved suppression ratio at high frequency range. Combined placement and sizing of the decoupling capacitors have achieved more than 10 dB suppression of the electromagnetic radiated emission over a wide spectrum range
Keywords :
capacitors; electromagnetic compatibility; electromagnetic interference; interference suppression; printed circuit testing; test facilities; TEM cell; antenna model; circuit simulation; electromagnetic radiated emission; electromagnetic radiated emission suppression; high frequency; on-PCB decoupling capacitors; on-chip current drivers; on-chip decoupling capacitors; parasitic inductance; power/ground fluctuation; radiated emission source; separated frequency characteristics; suppression ratio; wide spectrum range; Capacitors; Digital circuits; Electromagnetic radiation; Frequency; Inductance; Network-on-a-chip; Packaging; Parasitic capacitance; Printed circuits; Voltage fluctuations;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2001. EMC. 2001 IEEE International Symposium on
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7803-6569-0
Type :
conf
DOI :
10.1109/ISEMC.2001.950698
Filename :
950698
Link To Document :
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