DocumentCode
3497378
Title
The future of nanoelectronics is black: From silicon to hexagonal carbon
Author
Schwalke, Udo
Author_Institution
Inst. for Semicond. Technol. & Nanoelectron., Tech. Univ. Darmstadt, Darmstadt, Germany
fYear
2013
fDate
9-12 Sept. 2013
Firstpage
1
Lastpage
5
Abstract
Silicon has been the ultimate semiconductor material in micro- and nanoelectronics for more than 50 years. However, the use of pure silicon based devices will come to an end when CMOS downscaling will soon reach its physical limits. In order to gain performance, new materials with high carrier mobility are required. Hexagonal carbon seems to be a promising alternative to build high performance electronic devices. For example, carbon nanotube field-effect transistors (CNTFETs) can be used as active devices in integrated circuits and as memory cells. More recently, another hexagonal carbon modification became the focus of scientific attention: graphene. Just a few years after the Nobel Prize Award in 2010 for the graphene discovery, graphene-based transistors are emerging as other potential candidates to extend and eventually replace the traditional silicon MOSFET. This contribution will give a brief overview on the recent progress achieved in carbon-based nanoelectronics.
Keywords
CMOS integrated circuits; MOSFET; carrier mobility; elemental semiconductors; graphene; nanoelectronics; silicon; C; CMOS downscaling; CNTFETs; Si; active devices; carbon nanotube field-effect transistors; carbon-based nanoelectronics; graphene-based transistors; hexagonal carbon modification; high carrier mobility; high performance electronic devices; integrated circuits; memory cells; microelectronics; nanoelectronics; semiconductor material; silicon MOSFET; CNTFETs; Carbon; Carbon nanotubes; Fabrication; Graphene; Silicon; CNTFET; Carbon Nanoelectronics; Carbon Nanotubes; GFET; Graphene; Silicon CMOS;
fLanguage
English
Publisher
ieee
Conference_Titel
AFRICON, 2013
Conference_Location
Pointe-Aux-Piments
ISSN
2153-0025
Print_ISBN
978-1-4673-5940-5
Type
conf
DOI
10.1109/AFRCON.2013.6757838
Filename
6757838
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