Title :
Single-cycle, pulse-shaped critical path monitor in the POWER7+ microprocessor
Author :
Drake, Alan J. ; Floyd, M.S. ; Willaman, Richard L. ; Hathaway, Derek J. ; Hernandez, Jaime ; Soja, Crystal ; Tiner, Marshall D. ; Carpenter, Gary D. ; Senger, Robert M.
Author_Institution :
IBM Res., Austin, TX, USA
Abstract :
A 32nm SOI critical path monitor (CPM) that can provide timing measurements to a Digital PLL for dynamic frequency adjustments in the 8-core POWER7+™ microprocessor is described. The CPM calibrates to within 2% of cycle time from nominal to turbo voltages. Its voltage sensitivity is 10mV/bit. It tracks processor temperature sensitivity to within 1.5% of nominal frequency, and has a sample jitter less than 1.5% of nominal frequency. The ability to detect noise dynamically allows the system to operate the processor closer to its optimal frequency for any given voltage, resulting in lower voltage for power savings or higher frequency for performance improvements.
Keywords :
elemental semiconductors; microprocessor chips; silicon-on-insulator; 8-core POWER7+ microprocessor; SOI CPM; SOI critical path monitor; digital PLL; dynamic frequency adjustment; dynamic noise detection; nominal frequency; nominal voltage; power savings; processor temperature sensitivity; single-cycle pulse-shaped critical path monitor; timing measurement; turbo voltage; voltage sensitivity; Calibration; Delays; Detectors; Image edge detection; Latches; Wires; Critical Path Monitor; DVFS; calibration; process variation;
Conference_Titel :
Low Power Electronics and Design (ISLPED), 2013 IEEE International Symposium on
Conference_Location :
Beijing
Print_ISBN :
978-1-4799-1234-6
DOI :
10.1109/ISLPED.2013.6629293