• DocumentCode
    349758
  • Title

    Nonlinear circuit fault diagnosis with large change sensitivity

  • Author

    Worsman, Matthew ; Wong, Mike W T

  • Author_Institution
    Dept. of Electron. Eng., Hong Kong Polytech. Univ., Hung Hom, Hong Kong
  • Volume
    2
  • fYear
    1998
  • fDate
    1998
  • Firstpage
    225
  • Abstract
    Until now, large change sensitivity based fault diagnosis has been limited to the AC frequency domain. This paper presents a method to use large change sensitivity for nonlinear circuit fault diagnosis in the DC domain. Combined with the previous DC technique we propose an algorithm for constructing a nonlinear circuit fault dictionary. Advantages of this algorithm are that the benefits of large change sensitivity, namely computational efficiency, become available for nonlinear circuit testing. The method is restricted to single faults and circuits with one nonlinear resistor. Possible generalisation of the work is also discussed
  • Keywords
    analogue circuits; circuit optimisation; circuit simulation; fault diagnosis; frequency-domain analysis; nonlinear network analysis; sensitivity analysis; DC frequency domain; analog fault diagnosis; change sensitivity; circuit fault dictionary; circuit testing; computational efficiency; generalisation; nonlinear circuit fault diagnosis; nonlinear resistor; single faults; Circuit faults; Circuit simulation; Circuit testing; Dictionaries; Equations; Fault diagnosis; Frequency; Nonlinear circuits; Observability; Resistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronics, Circuits and Systems, 1998 IEEE International Conference on
  • Conference_Location
    Lisboa
  • Print_ISBN
    0-7803-5008-1
  • Type

    conf

  • DOI
    10.1109/ICECS.1998.814868
  • Filename
    814868